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▼ TitleAuthors▼ Journal/Conference▲ YearDownload
Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging S. Y. Lim, M. Forster, D. Macdonald Journal of Crystal Growth 364, 67-73 (2013). 2013 (1.3MB)
Trade-offs between impurity gettering, bulk degradation, and surface passivation of boron rich layers on silicon solar cells Sieu Pheng Phang, Wensheng Liang, Bettina Wolpensinger, Michael Andreas Kessler and Daniel Macdonald IEEE Journal of Photovoltaics 3 (1), pp. 261 - 266 (2013). 2013 (575KB)
Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers S. Y. Lim, M. Forster M, X. Zhang X, J. Holtkamp, M.C. Schubert, A. Cuevas, D. Macdonald IEEE journal of Photovoltaics, Volume: PP Issue: 99 Page: 1-7 2013 (903KB)
Physical model of back line-contact front-junction solar cells Andres Cuevas Journal of Applied Physics 113, 164502 (2013) 2013 (1.5MB)
Theory of the circular closed loop antenna in the terahertz, infrared, and optical regions A. F. McKinley, T. P. White, K. R. Catchpole AIP Journal of Applied Physics 2013 (2.0MB)
Imaging of the interstitial iron concentration in B-doped c-Si based on time-dependent photoluminescence imaging S. Herlufsen, D. Macdonald, K. Bothe and J. Schmidt Proceedings of the 27th European Photovoltaic Solar Energy Conference, Frankfurt, Germany (2012), pp. 990-993. 2012 (797KB)
Light-enhanced surface passivation of TiO2-coated silicon A. F. Thomson and K. R. McIntosh Progress in Photovoltaics: Research and Applications 20, 343-349. 2012
Acceptor-related metastable defects in compensated n-type silicon Rougieux, Fiacre, Phang, Sieu Pheng, Shalav, Avi, Lim, Bianca, Schmidt, Jan, MacDonald, Daniel, Cuevas, Andres International Photovoltaic Science and Engineering Conference (PVSEC 2012) 2012
Surface passivation of c-Si by atmospheric pressure chemical vapordeposition of Al2O3 Black, Lachlan, McIntosh, Keith Applied Physics Letters 2012
Determination of the Magnitude and Centroid of the Charge in a Thin-film Insulator by CV and Kelvin Probe Measurements K. R. McIntosh, L. E. Black, S. C. Baker-Finch, T. C. Kho and Y. Y. Wan Energy Procedia 15, 162-170. 2012 (399KB)

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