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▼ TitleAuthors▼ Journal/Conference▲ YearDownload
Trade-offs between impurity gettering, bulk degradation, and surface passivation of boron rich layers on silicon solar cells Sieu Pheng Phang, Wensheng Liang, Bettina Wolpensinger, Michael Andreas Kessler and Daniel Macdonald IEEE Journal of Photovoltaics 3 (1), pp. 261 - 266 (2013). 2013 (575KB)
Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers S. Y. Lim, M. Forster M, X. Zhang X, J. Holtkamp, M.C. Schubert, A. Cuevas, D. Macdonald IEEE journal of Photovoltaics, Volume: PP Issue: 99 Page: 1-7 2013 (903KB)
Physical model of back line-contact front-junction solar cells Andres Cuevas Journal of Applied Physics 113, 164502 (2013) 2013 (1.5MB)
Theory of the circular closed loop antenna in the terahertz, infrared, and optical regions A. F. McKinley, T. P. White, K. R. Catchpole AIP Journal of Applied Physics 2013 (2.0MB)
Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging S. Y. Lim, M. Forster, D. Macdonald Journal of Crystal Growth 364, 67-73 (2013). 2013 (1.3MB)
One-dimensional photogeneration profiles in silicon solar cells with pyramidal texture S. C. Baker-Finch and K. R. McIntosh Progress in Photovoltaics: Research and Applications 20, 51-61. 2012 (1.5MB)
Impact of incomplete ionization of dopants on the electrical properties of compensated p-type silicon Forster, Maxime, Cuevas, Andres, Fourmond, E, Rougieux, Fiacre, Lemiti, M Journal of Applied Physics 2012
A contactless method for determining the carrier mobility sum in silicon wafers F. E. Rougieux, P. Zheng, M. Thiboust, J. Tan, N. E. Grant, D. H. Macdonald and A. Cuevas Photovoltaics, IEEE Journal of 2, 41-46 2012 (579KB)
Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation Wan, Yimao, McIntosh, Keith, Thomson, Andrew IEEE Photovoltaic Specialists Conference (PVSC 2012) 2012
On the method of photoluminescence spectral intensity ratio imaging of silicon bricks: Advances and limitations Bernhard Mitchell, J├╝rgen W. Weber, Daniel Walter, Daniel Macdonald, and Thorsten Trupke Journal of Applied Physics 112, 063116 (2012). 2012 (4.5MB)

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