Impact of lateral non-uniform carrier lifetime on photoconductance based lifetime measurements
Wensheng Liang (Research School of Engineering)
SOLAR SEMINAR SERIESDATE: 2011-11-24
TIME: 15:00:00 - 16:00:00
LOCATION: Ian Ross Seminar Room
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ABSTRACT:
The impact of lateral non-uniform carrier lifetime on the determination of the lifetime from photoconductance-based measurements, based on the self-consistent method proposed by Trupke and Bardos, is investigated using a simple model. It is shown that the method will always result in an overestimation of the mean lifetime, with the magnitude of the error mainly dependent on the distribution of the effective lifetime across the area sensed by the photoconductance coil. While in many cases, the error introduced will be relatively small (in the order of 5% or less), much larger errors can result in some cases, such as for samples which feature small areas with a significantly higher than average lifetime.Experimental measurements confirm the model predictions.
BIO:
Wensheng Liang received his B.Eng., M.Eng. from Northeastern University located in Shenyang, China. Now he is a PhD student in CSES doing research about solar cell surface passivation by ALD(Atomic Layer Deposition) Al2O3.
